Powerful, Scalable, & Easy to Use IntelligenT Data Analytics
The trusted solution for enhancing yields, reducing defects per million (DPM), and optimizing semiconductor manufacturing processes.
The Galaxy Difference
Galaxy Semiconductor distinguishes itself through a blend of deep technical expertise, a commitment to quality, and a broad product portfolio. With a foundation dating back to 1998, the company has become the most trusted company in test data analysis and IC yield management, providing "semiconductor intelligence" and software solutions that enhance decision-making and process improvement.
Technical
Expertise
Commitment to Quality
Broad Product Portfolio
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Semiconductor intelligence
Experience the future of semiconductor test data analytics with Galaxy's industry-leading semiconductor software solutions, delivering unrivaled efficiency, cost savings, and groundbreaking insights.
HYPERDRIVE
Converts overwhelming process data streams into concise, actionable insights to empower engineers to anticipate and prevent equipment issues, reduce downtime and enhance productivity.
- Advanced machine learning algorithms for prediction of downstream metrology results.
- Automatically validates, cleans, and aligns data
EXAMINATOR-PRO
Ideal for device characterization, reliability assessment, and yield analysis, it serves as a scalable solution for product, and test engineers from first silicon through production.
YIELD-MAN
Offers unattended monitoring, scheduled reporting, and real-time alerts, ensuring that production stays within the expected yield parameters and equipping engineers with the tools for detailed analysis should anomalies arise.
PAT-MAN
Excels in detecting and excluding outlier devices that could compromise long-term reliability. It balances defects per million (DPM) and yield, integrating seamlessly with existing test environments to deliver industry-leading DPM reduction.
Parsing wizard
Galaxy Semiconductor’s Parsing Wizard helps to easily import custom data without any custom parsers or development, especially if it’s not one of the 120 test data formats already accepted.